Preface ........................................................ ix
About the Editor ............................................... xi
List of Contributors ......................................... xiii
SECTION I Devices
Chapter 1 Radiation Damage in Silicon .......................... 3
Gianluigi Casse
Chapter 2 Radiation-Tolerant CMOS Single-Photon Imagers for
Multiradiation Detection ............................ 31
Edoardo Charbon, Lucio Carrara, Cristiano Niclass,
Noémy Scheidegger, and Herbert Shea
Chapter 3 Effects of Hydrogen on the Radiation Response of
Field-Oxide Field-Effect Transistors and High-K
Dielectrics ......................................... 51
Xing J. Zhou, Daniel M. Fleetwood, and Ronald
D. Schrimpf
Chapter 4 Novel Total Dose and Heavy-Ion Charge Collection
Phenomena in a New SiGe HBT on Thin-Film SOI
Technology .......................................... 69
Gregory Avenier, Marco Bellini, Alain Chantre,
Peng Cheng, Pascal Chevalier, John D. Cressler,
Ryan M. Diestelhorst, Paul W. Marshall, Stanley
D. Phillips, and Marek Turowski
Chapter 5 Radiation-Hard Voltage and Current References in
Standard CMOS Technologies .......................... 91
Vladimir Gromov and Anne-Johan Annema
Chapter 6 Nanocrystal Memories: An Evolutionary Approach to
Flash Memory Scaling and a Class of Radiation-
Tolerant Devices ................................... 103
Cosimo Gerardi, Andrea Cester, Salvatore
Lombardo, Rosario Portoghese, and Nicola Wrachien
SECTION II Circuits and Systems
Chapter 7 Radiation Hardened by Design SRAM Strategies for
TID and SEE Mitigation ............................. 151
Lawrence T. Clark
Chapter 8 A Complete Guide to Multiple Upsets in SRAMs
Processed in Decananometric CMOS Technologies ...... 195
Gilles Gasiot and Phillippe Roche
Chapter 9 Real-Time Soft Error Rate Characterization of
Advanced SRAMs ..................................... 225
Jean-Luc Autran, Gilles Gasiot, Daniela Munteanu,
Philippe Roche, and Sebastien Sauze
Chapter 10 Fault Tolerance Techniques and Reliability
Modeling for SRAM-Based FPGAs ...................... 249
Keith S. Morgan, Michael Caffrey, James Carroll,
Derrick Gibelyou, Paul Graham, William Howes,
Jonathan Johnson, Daniel McMurtrey, Patrick
Ostler, Brian Pratt, Heather Quinn, and Michael
Wirthlin
Chapter 11 Assuring Robust Triple Modular Redundancy
Protected Circuits in SRAM-Based FPGAs ............. 273
Michael Caffrey, Paul Graham, Jim Krone, Kevin
Lundgreen, Keith S. Morgan, Brian Pratt, and
Heather Quinn
Chapter 12 SEU/SET Tolerant Phase-Locked Loops ................ 305
Robert L. Shuler, Jr.
Chapter 13 Autonomous Detection and Characterization of
Radiation-Induced Transients in Semiconductor
Integrated Circuits ................................ 325
Balaji Narasimham, Bharat L. Bhuva, Ronald D.
Schrimpf, Lloyd W. Massengill, William Timothy
Holman, and Arthur F. Witulski
Chapter 14 Soft Errors in Digital Circuits: Overview and
Protection Techniques for Digital Filters .......... 357
Pedro Reviriego Vasallo and Juan Antonio Maestro
Chapter 15 Fault-Injection Techniques for Dependability
Analysis: An Overview .............................. 385
Massimo Violante
Index ......................................................... 405
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