Preface ...................................................... xiii
MATLAB® Disclaimer ........................................... xvii
Editors ....................................................... xix
Contributors .................................................. xxi
PART I Introduction
Introduction .................................................... l
1 Big Picture and Some History of the Field .................... 3
John D. Cressler
2 Extreme Environments in NASA Planetary Exploration .......... 11
Elizabeth Kolawa, Mohammad Mojarradi, and Linda Del
Castillo
3 Extreme Environment Electronics in NASA's Heliophysics
Vision ...................................................... 23
Dana Brewer and Janet Barth
4 Overview of the NASA ETDP RHESE Program ..................... 29
Andrew S. Keys
5 Role of Extreme Environment Electronics in NASA's
Aeronautics Research ........................................ 41
Gary W. Hunter and Dennis Culley
6 Technology Options for Extreme Environment Electronics ...... 49
Jonathan A. Pellish and Lewis M. Cohn
PART II Background
Introduction John D. Cressler .................................. 59
7 Physics of Temperature and Temperature's Role in Carrier
Transport ................................................... 61
John D. Cressler and Kurt A. Moen
8 о verview of Radiation Transport Physics and Space
Environments ................................................ 71
Robert Reed and Janet Barth
9 Interaction of Radiation with Semiconductor Devices ......... 79
Kenneth F. Galloway and Ronald D. Schrimpf
PART III Environments and Prediction Tools
Introduction John D. Cressler .................................. 93
10 Orbital Radiation Environments .............................. 95
Michael Xapsos
11 CRÈME96 and Related Error Rate Prediction Methods .......... 107
James H. Adams, Jr.
12 Monte Carlo Simulation of Radiation Effects ................ 123
Robert A. Weller
13 Extreme Environments in Energy Production and Utilization .. 137
Alexander B. Lostetter
14 Extreme Environments in Transportation ..................... 145
Peter Wilson and H. Alan Mantooth
PART IV Semiconductor Device Technologies for Extreme
Environments
Introduction John D. Cressler ................................ 154
15 Radiation Effects in Si CMOS Platforms ..................... 155
Lloyd W. Massengill
16 Wide Temperature Range Operation of Si CMOS Platforms ...... 175
Aravind C. Appaswamy
17 Trade-Offs between Performance and Reliability in Sub-
100nm RF-CMOS on SOI Technologies .......................... 185
Rajan Arora
18 SiGe HBT Platforms ......................................... 197
John D. Cressler
19 Using Temperature to Explore the Scaling Limits of SiGe
HBTs ....................................................... 211
Jiahui Yuan
20 SiC Integrated Circuit Platforms for High-Temperature
Applications ............................................... 225
Philip G. Neudeck
21 Passive Elements in Silicon Technology ..................... 233
Edward P. Wilcox
22 Power Device Platforms ..................................... 243
H. Alan Mantooth
23 CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme
Environments ............................................... 253
Trevor J. Thornton, William Lepkowski, Seth J. Wilk,
Mohammad Reza Ghajar, Asha Balijepalli, and Joseph Ervin
24 Ill-Nitride Platforms ...................................... 263
Shyh-Chiang Shen
25 Photonic Devices ........................................... 275
Cheryl J. Marshall
26 Radiation Hardening by Process ............................. 287
Michael L. Alles
27 Rad-Hard Silicon Technologies at BAE Systems ............... 297
Richard W. Berger
28 Rad-Hard Silicon Technologies at Honeywell ................. 305
Paul S. Fechner and Jerry Yue
29 High-Temperature SOI Technologies at Honeywell ............. 319
Bruce Ohme
PART V Modeling for Extreme Environment Electronic Design
Introduction H. Alan Mantooth ................................ 332
30 TCAD of Advanced Transistors ............................... 333
Guofu Niu
31 Mixed-Mode TCAD Tools ...................................... 345
Ashok Raman and Marek Turowski
32 Mixed-Mode TCAD for Modeling of Single-Event Effects ....... 359
Kurt A. Moen and Stanley D. Phillips
33 Compact Modeling of SiGe HBTs .............................. 373
Guofu Niu and Lan Luo
34 Compact Modeling of CMOS Devices ........................... 387
A. Matt Francis
35 Compact Modeling of LDMOS Transistors ...................... 397
Avinash S. Kashyap
36 Compact Modeling of Power Devices .......................... 409
Ту R. McNutt
37 Best Practices for Modeling Radiation Effects in Mixed-
Signal Circuits ............................................ 419
Jeffrey S. Kauppila
38 Compact Model Toolkits ..................................... 431
Jim Holmes and A. Matt Francis
PART VI Device and Circuit Reliability in Extreme
Environments
Introduction John D. Cressler ................................. 441
39 Failure Mechanisms in Modern Integrated Circuits and
Industry Best Practices for Reliability Degradation
Predictions ................................................ 443
Fernando Guarin
40 Considerations for the Reliability Estimation of SiGe
HBTs ....................................................... 451
Fernando Guarin
41 Considerations for the Reliability Estimation of Silicon
CMOS ....................................................... 455
Stewart Rauch
42 Qualification Methodology for Extreme Environment
Electronics ................................................ 459
Yuan Chen
PART VII Circuit Design for Extreme Environments
Introduction H. Alan Mantooth ................................ 473
43 Best Practices in Radiation Hardening by Design ............ 475
Jeffrey D. Black
44 Investigations of RHBD Techniques for SiGe Devices and
Circuits ................................................... 485
Stanley D. Phillips and Kurt A. Moen
45 Best Practices in Wide Temperature Range Circuit Design .... 497
Benjamin J. Blalock
46 Achieving Invariability in Analog Circuits Operating in
Extreme Environments ....................................... 509
Peter Wilson, Robert Rudolf, and Reuben Wilcock
PART VIII Examples of Extreme Environment Circuit Designs
Introduction H. Alan Mantooth ................................ 520
47 Voltage and Current References ............................. 521
Laleh Najafizadeh
48 Operational Amplifiers ..................................... 529
Benjamin J. Blalock
49 Cryogenic Low-Noise Amplifiers ............................. 545
Joseph C. Bardin
50 Active Filters ............................................. 563
Fa Foster Dai and Desheng Ma
51 Analog-to-Digital Converters ............................... 579
Benjamin J. Blalock
52 Digital-to-Analog Converters ............................... 585
Fa Foster Dai, Yuan Yao, and Zhenqi Chen
53 CMOS Phase-Locked Loops .................................... 601
T. Daniel Loveless
54 Low-Voltage, Weakly Saturated SiGe HBT Circuits ............ 619
Sachin Seth
55 Memory Circuits ............................................ 629
Richard W. Berger
56 Field Programmable Gate Arrays ............................. 641
Melanie Berg
57 Microprocessors and Microcontrollers ....................... 657
Kenneth Li and Michael Johnson
58 Asynchronous Digital Circuits .............................. 663
Jia Di and Scott C. Smith
59 Characterizing SETs in Oscillator Circuits ................. 675
Stephen J. Horst
60 Low-Voltage Power Electronics .............................. 687
Mohammad Mojarradi and Philippe Adell
61 Medium-Voltage Power Electronics ........................... 699
Marcelo Schupbach
62 SiC JFET Integrated Circuits for Extreme Environment
Electronics ................................................ 713
Philip G. Neudeck, Michael J. Krasowski, and
N.F. Prokop
63 Using CMOS-Compatible SOI MESFETs for Power Supply
Management ................................................. 723
William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar,
Michael Goryll, Keith Hobert, Bertan Bakkaloglu, and
Trevor J. Thornton
PART IX Verification of Analog and Mixed-Signal Systems
Introduction H. Alan Mantooth ................................ 733
64 Model-Based Verification ................................... 735
Jim Holmes
65 Event-Driven Mixed-Signal Modeling Techniques for System-
in-Package Functional Verification ......................... 749
Chip Webber
PART X Packaging for Extreme Environments
Introduction John D. Cressler ................................ 763
66 Electronic Packaging Approaches for Low-Temperature
Environments ............................................... 765
R. Wayne Johnson
67 Electronic Packaging Approaches for High-Temperature
Environments ............................................... 777
R. Wayne Johnson
68 Failure Analysis of Electronic Packaging ................... 791
Linda Del Castillo
69 Silicon Carbide Power Electronics Packaging ................ 803
Jared Hornberger, Brice McPherson, and Brandon Passmore
PART XI Real-World Extreme Environment Applications
Introduction H. Alan Mantooth ................................ 820
70 A SiGe Remote Sensor Interface ............................. 821
Ryan M. Diestelhorst
71 A SiGe Remote Electronics Unit ............................. 831
Troy D. England
72 Distributed Motor Controller for Operation in Extreme
Environments ............................................... 839
Colin McKinney
73 Radiation-Hard Multichannel Digitizer ASIC for Operation
in the Jovian Environment .................................. 849
Shahid Aslam, Akin Akturk, and Gerard Quilligan
74 Approaches to Commercial Communications Satellite Design ... 863
David A. Sunderland
75 UHF Micro-Transceiver Development Project .................. 873
William Kuhn and Yogesh Tugnawat
76 Down-Hole Instrumentation Package for Energy Well
Drilling ................................................... 883
Randy Normann
77 Electronics Requirements for Collider Physics Experiments .. 887
Alexander A. Grillo
78 Cryogenic Electronics for High-Energy Physics Experiments .. 895
Veljko Radeka, Gianluigi de Geronimo, and Shaorui Li
79 Radar Systems for Extreme Environments ..................... 909
Tushar Thrivikraman
PART XII Appendices
Appendix A: Properties of Silicon and Germanium ............... 925
John D. Cressler
Appendix B: Temperature and Energy Scales ..................... 927
John D. Cressler
Appendix C: Planetary Temperature Ranges and Radiation
Levels ..................................................... 931
H. Alan Mantooth
Appendix D: Ionizing Radiation Test Facilities ................ 935
Paul W. Marshall
Appendix E: Radiation Testing Protocols and Mil-Spec
Standards .................................................. 943
Ronald Pease
Appendix F: Primer on the Semiconductor Transport Equations
and Their Solution ......................................... 949
John D. Cressler and Guofu Niu
Appendix G: Primer on MOSFETs ................................. 959
H. Alan Mantooth
Appendix H: Primer on Si and SiGe Bipolar Transistors ......... 963
John D. Cressler
Appendix I: Compendium of NASA's COTS Radiation Test Data ..... 973
Martha O'Bryan
Appendix J: Compendium of NASA's COTS Extreme Temperature
Test Data .................................................. 977
Richard L. Patterson and Ahmad Hammoud
Index ......................................................... 989
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